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Mechanism for the Large Conductance Modulation in Electrolyte-gated Thin Gold Films

机译:电解栅控薄膜中大电导调制的机理   金膜

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摘要

Electrolyte gating using ionic liquid electrolytes has recently generatedconsiderable interest as a method to achieve large carrier density modulationsin a variety of materials. In noble metal thin films, electrolyte gatingresults in large changes in sheet resistance. The widely accepted mechanism forthese changes is the formation of an electric double layer with a charged layerof ions in the liquid and accumulation or depletion of carriers in the thinfilm. We report here a different mechanism. In particular, we show using x-rayabsorption near edge structure (XANES) that the previously reported largeconductance modulation in gold films is due to reversible oxidation andreduction of the surface rather than the charging of an electric double layer.We show that the double layer capacitance accounts for less than 10\% of theobserved change in transport properties. These results represent a significantstep towards understanding the mechanisms involved in electrolyte gating.
机译:最近,使用离子液体电解质进行电解质浇注已引起相当大的兴趣,作为在多种材料中实现大载流子密度调制的方法。在贵金属薄膜中,电解质门控导致薄层电阻的较大变化。广泛接受的机制变化是在液体中形成带电荷的离子层的双电层,并在薄膜中积累或耗尽载流子。我们在这里报告了一种不同的机制。特别是,我们使用x射线吸收近边缘结构(XANES)来显示先前报道的金膜中的大电导调制是由于表面的可逆氧化和还原而不是双电层的充电所致。占不到所观察到的运输特性变化的10%。这些结果代表了理解电解质门控机制的重要一步。

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